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DTS 2019: IEEE international conference on Design & Test of integrated micro & nano-Systems - Call for paper, ranking, acceptance rate, submission deadline, notification date, conference location, submission guidelines, and other important details


This article provides the call for paper, ranking, acceptance rate, submission deadline, notification date, conference location, submission guidelines, and other important details of DTS 2019: IEEE international conference on Design & Test of integrated micro & nano-Systems all at one place.

Conference Location Gammarth, Tunisia
Conference Date 2019-04-28
Notification Date 2019-03-12
Submission Deadline 2019-02-04
Conference Website and Submission Link http://dts-conf.org/


Conference Ranking


IEEE international conference on Design & Test of integrated micro & nano-Systems ranking based on CCF, Core, and Qualis is shown below:

CCF Ranking
Core Ranking
Qualis Ranking

Click here to check the ranking of any conference.
  • About CCF Ranking: The Chinese Computing Federation (CCF) Ranking provides a ranking of peer-reviewed journals and conferences in the field of computer science.

  • About Core Ranking: The CORE Conference Ranking is a measure to assess the major conference in the computing field. This ranking is governed by the CORE Executive Committee. To know more about Core ranking, visit Core ranking portal.

  • About Qualis Ranking: This conference ranking is published by the Brazilian ministry of education. It uses the h-index as a performance metric to rank conferences. Conferences are classified into performance groups that range from A1 (to the best), A2, B1, B2,..., B5 (to the wost). To know more about qualis ranking, visit here

Conference Acceptance Rate


Below is the acceptance rate of IEEE international conference on Design & Test of integrated micro & nano-Systems conference for the last few years:

Year Submitted Papers Accepted Papers Accepted Percentage/Acceptance Rate

We are working hard to collect and update the acceptance rate details of the conferences for recent years. However, you can consider the above (if available) acceptance rates to predict the average chances of acceptance of your research paper at this conference.



Conference Call for paper


Systems Design & Technology (SDT) :
Analog, digital, mixed, and RF circuits design
SoC, MPSoC, NoC, SIP, and NIP design
Embedded electronics and System architecture
MEMS, NEMS and MOEMS systems design
Low-power electronics and systems design
Sensory Systems Design
Wireless communication systems design
Opto-electronic System Design
Biomedical Circuit & Systems
Bio-engineering & Bio-chip design
Linear & Non-Linear Circuits
Power electronics and systems design
Hardware co-design & FPGA design
VLSI systems circuit and design
DSPs and multiprocessor systems
Embedded systems for Deep Learning
Control Systems & Mechatronics
Algorithms, methods and tools for modeling, simulation, synthesis and verification of ICs
Algorithms, methods and tools for signal processing and image processing
Algorithms, methods and tools for information security and cryptography
Artificial Intelligence systems
Electronic systems for energy harvesting applications
GPS based engineering systems
Process technologies, CMOS, BiCMOS, GaAs
Microwave Systems & Integrated antenna
3D integration design and analysis
ICs packagingSystems Testing & Reliability (STR) :
Analog, digital, mixed, and RF circuits testing
SoC, MPSoC, NoC, SIP, and NIP test
On-line Testing and fault Tolerance
Defect and Fault Modeling
MEMS, NEMS and MOEMS Testing
3D testing
Delay testing
DFT, BIST and BISR
Fault Simulation, ATPG
Yield Optimization
Memory & FPGA Test and Repair
Automotive reliability and test
Reliability failures and modeling
Electronic System Reliability
Test and Security Issues
ATE issues
Alternatives test strategiesNano Electronic Systems (NES) :
Nanostructured / nanoporous Materials and devices
Nano-circuits and Nano-architectures
Nano-sensors and Actuators
Nanorobotics and Nano-manipulation
Modeling and Simulation at the Nanoscale
Carbon Nanostructures and devices
Microfluidics and Nanofluidics Systems
3D printing systems
Polymer Nanotechnology
Nanoscale Materials Characterization
Sensors based on emerging devices
Renewable Energy Technologies
Smart Grid
Measurement of health risk
Aerospace and Vehicle ManufacturersVLSI IoT Devices (IoT) :
Ultra-low power VLSI design for IoT
System on Chip for IoTs
IoT Application oriented Technologies
IoT communication systems
Real-time IoT systems
RFID systems
IoT Services and Applications
IoT nodes architectures
Sensors and Actuators for IoT
Power and Energy systems design for IoT nodes
Connectivity for IoT
Computing Platforms for IoT
Data Acquisition, Storage and Management for IoT
Security and Privacy Enhancing Technologies for IoT devices
IoT System Interfaces
Reliability of IoT VLSI

Submission Deadline


DTS 2019: IEEE international conference on Design & Test of integrated micro & nano-Systems submission deadline is 2019-02-04.

Note: It is generally recommended to submit your conference paper on or before the submission deadline. Generally, conferences do not encourage to submit the research paper after the deadline is over. In rare scenarios, conferences extend their deadline. Decision about the extension of the deadline is generally updated on the official conference webpage.


Notification date


Notification date of DTS 2019: IEEE international conference on Design & Test of integrated micro & nano-Systems is 2019-03-12.

Note: This is the date on which conference announces the result about acceptance or rejection of submitted papers. If your research paper is accepted, the conference will request you to submit the camera ready version of your research paper by the due date. Due date to submit the camera ready version of the paper is generally posted on the official web page of the conferences or notified to you via. email.


Conference Date


DTS 2019: IEEE international conference on Design & Test of integrated micro & nano-Systems will start on 2019-04-28.

Note: This is the date on which the conference starts.


Conference Location


DTS 2019: IEEE international conference on Design & Test of integrated micro & nano-Systems will be organized at Gammarth, Tunisia. This is the place where the conference is organized and the research paper is to be presented.