![]() VDAT 2024 : 28th International Symposium on VLSI Design and Test (VDAT-2024)Vellore, Tamil Nadu, India |
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When: Sep 1, 2024 - Sep 3, 2024 Submission Deadline: May 15, 2024 | ||
Authors are invited to submit original, unpublished research manuscripts on the above topics. Papers should be submitted in pdf format (Portable Document Format) as per the IEEE Conference paper form... | ||
ELECTRONICS ENGINEERING COMPUTER SCIENCE VLSI DESIGN | ||
![]() CSET 2024 : Cyber Security Experimentation and Test (CSET)Philadelphia, PA |
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When: Aug 13, 2024 - Aug 13, 2024 Submission Deadline: May 17, 2024 | ||
For 16 years, the Workshop on Cyber Security Experimentation and Test (CSET) has been an important and lively space for discussing all encompassing cybersecurity topics related to reliability, validi... | ||
CYBERSECURITY | ||
![]() DTTIS 2024 : IEEE 2nd International conference on Design, Test & Technology of Integrated SystemsAix-En-Provence - FRANCE |
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When: Oct 14, 2024 - Oct 16, 2024 Submission Deadline: May 1, 2024 | ||
DTTIS 2024 is, by design, a forum where researchers, engineers, and graduate students converge to transcend the boundaries between design and technology of integrated circuits. The forthcoming second... | ||
INTEGRATED SYSTEMS DESIGN NTEGRATED SYSTEMS TECHNOLOGY INTEGRATED SYSTEMS TESTING AND | ||
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When: May 28, 2024 - May 28, 2024 Submission Deadline: Jan 29, 2024 | ||
Recommended Topics or Themes • Concepts of software test architecture • - Software test architecture for machine learning systems • - Abstraction of test cases (e.g. test levels, te... | ||
SOFTWARE TESTING SOFTWARE QUALITY SOFTWARE TESTING METHODOLOGY | ||
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When: Mar 12, 2024 - Mar 12, 2024 Submission Deadline: Dec 18, 2023 | ||
*** DEADLINE EXTENDED: Paper submission until Dec 18, 2023 AoE *** • VST 2024 -- 7th International Workshop on • Validation, Analysis and Evolution of Software Tests • March 12, 202... | ||
SOFTWARE TESTING TEST VALIDATION TEST CASE GENERATION TEST EVOLUTION | ||
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When: Nov 1, 2023 - Nov 4, 2023 Submission Deadline: Jul 4, 2023 | ||
*** DTTIS 2023 - Call For Contributions *** • --- DTTIS conference (International Conference on Design, Test and Technology of Integrated Systems) --- • Venue: Gammarth, Tunisia • D... | ||
DESIGN TEST TECHNOLOGY INTEGRATED SYSTEMS | ||
![]() A-TEST 2023 : 14th Workshop on Automating Test Case Design, Selection and EvaluationKirchberg, Luxembourg |
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When: Sep 15, 2023 - Sep 15, 2023 Submission Deadline: Jul 21, 2023 | ||
********************************************************************** • CALL FOR PAPERS • ********************************************************************** • A-TEST 2023 &bul... | ||
SOFTWARE TESTING TEST AUTOMATION | ||
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When: Dec 6, 2023 - Dec 7, 2023 Submission Deadline: Jun 19, 2023 | ||
the “Test suites” sub-task will be included for the sixth time in the General MT Shared Task of the Conference on Machine Translation (WMT23). • *OVERVIEW* • Test suites are custom ex... | ||
MACHINE TRANSLATION | ||
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When: Apr 7, 2023 - Apr 7, 2023 Submission Deadline: Jun 19, 2023 | ||
Artificial Intelligence (AI) technologies are widely used in computer applications to perform tasks such as monitoring, forecasting, recommending, prediction, and statistical reporting. They are depl... | ||
AI TESTING | ||
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When: Nov 17, 2022 - Nov 18, 2022 Submission Deadline: Jul 28, 2022 | ||
********************************************************************** • CALL FOR PAPERS • ********************************************************************** • A-TEST 2022 &bul... | ||
SOFTWARE TESTING TEST AUTOMATION TEST TOOLS | ||
![]() IEEE AI TEST 2022 : IEEE AI TEST 2022San Francisco Bay Area |
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When: Aug 15, 2022 - Aug 18, 2022 Submission Deadline: Jul 28, 2022 | ||
Welcome to IEEE AITest 2022! • A conference of IEEE CISOSE 2022 International Congress • Artificial Intelligence (AI) technologies are widely used in computer applications to perform task... | ||
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When: Oct 16, 2022 - Oct 21, 2022 Submission Deadline: Jul 20, 2022 | ||
Models are purposeful abstractions of systems and their environments. They can be used to understand, simulate, and validate complex systems at different abstraction levels. Thus, the use of models i... | ||
FORMAL METHODS VERIFICATION MODELING TEST | ||
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When: Oct 3, 2022 - Oct 5, 2022 Submission Deadline: Apr 25, 2022 | ||
Sponsored by: IFIP WG 10.5, IEEE-CASS, IEEE CEDA, ACM SIGDA • Organization: University of Patras, Greece • VLSI-SoC 2022 is the 30th in a series of international conferences sponsored by ... | ||
VLSI CIRCUITS VERIFICATION TEST | ||
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When: Apr 2, 2022 - Apr 2, 2022 Submission Deadline: Feb 1, 2022 | ||
The First Workshop on Reproducibility and Replication of Research Results (RRRR 2022) is part of ETAPS 2022 in Munich, Germany. It provides a forum to present novel approaches to foster reproducibili... | ||
FORMAL METHODS VERIFICATION TEST SOFTWARE | ||
![]() VPT 2022 : Verification and Program TransformationMünchen, Germany |
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When: Apr 2, 2022 - Apr 2, 2022 Submission Deadline: Jan 17, 2022 | ||
The aim of the workshop is to bring together researchers working in the fields of Program Verification and Program Transformation. • There is a great potential for beneficial interactions betwe... | ||
FORMAL METHODS VERIFICATION TEST PROGRAM | ||
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Submission Deadline: Jun 11, 2022 | ||
International Journal of Electronic Design and Test(JEDT)Scope and TopicsInternational Journal of Electronic Design and Test(JEDT) is a peer-reviewed, open access journal which invites original works... | ||
ELECTRONIC SIMULATION MODULE DESIGN SIP TESTING | ||
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Submission Deadline: Mar 31, 2021 | ||
This special issue welcomes contributions regarding approaches, techniques, tools and experience reports about adopting and improving test automation cost/effectiveness, as well as empirical studies a... | ||
SOFTWARE TESTING SOFTWARE ENGINEERING | ||
![]() VTS 2021 : 39th IEEE VLSI Test SymposiumVirtual Interactive Live Event |
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When: Apr 25, 2021 - Apr 28, 2021 Submission Deadline: Nov 14, 2020 | ||
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in test, validation, yield, reliability and security of microelectronic circuits and systems. The 2021 edition of VT... | ||
VLSI EMERGING TECHNOLOGIES | ||
![]() DATE 2021 : Design, Automation and Test in Europe ConferenceGrenoble, France |
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When: Feb 01, 2021 - Feb 05, 2021 Submission Deadline: Sep 21, 2020 | ||
The 24th DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the design, test and manu... | ||
DESIGN AUTOMATION | ||
![]() ITC 2020 : International Test ConferenceWashington DC, USA |
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When: Nov 03, 2020 - Nov 05, 2020 Submission Deadline: May 01, 2020 | ||
International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design-fort... | ||
TEST DESIGN | ||
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Submission Deadline: Feb 14, 2020 | ||
International Journal of Electronic Design and Test(JEDT) is a peer-reviewed, open access journal which invites original works describing the methods used to design and test electronic product hardwar... | ||
ELECTRONICS ENGINEERING DESIGN AUTOMATION SIGNAL PROCESSING CIRCUITS | ||
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When: Jun 7, 2020 - Jun 10, 2020 Submission Deadline: Jan 14, 2020 | ||
CFP Link: http://dts-conf.org/CFP_DTS_2020.pdf • Aim of the Conference: The second international conference on Design & Test of integrated micro & nano-Systems represents a scientific and techno... | ||
SYSTEMS DESIGN & TECHNOLOGY SYSTEMS TESTING & RELIABILITY NANO ELECTRONIC SYSTEMS VLSI IOT DEVICES | ||
![]() A-TEST 2019 : Workshop on Automated Software TestingTallinn, Estonia |
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When: Aug 26, 2019 - Aug 27, 2019 Submission Deadline: Jun 7, 2019 | ||
A-TEST is a workshop of the 27th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE) • https://esec-fse19.ut.ee/ • CFP: ... | ||
SOFTWARE TESTING TEST AUTOMATION | ||
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Submission Deadline: Aug 31, 2019 | ||
International Journal of Electronic Design and Test(JEDT) Scope and Topics International Journal of Electronic Design and Test(JEDT) is a peer-reviewed, open access journal which invites original wor... | ||
ELECTRONICS ENGINEERING DESIGN AUTOMATION SIGNAL PROCESSING CIRCUITS | ||
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