About |
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International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design-fortest, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. ITC 2020 starts the second half century of the conference. Emerging technologies such as optical, biomedical, and quantum devices will require new test solutions. Artificial Intelligence (AI) and the need for trustworthy devices are providing both new challenges and new opportunities for off-chip and on-chip test. At the same time, more stringent quality requirements, especially in automotive applications, are requiring more efficient test, debug, monitoring, and repair techniques that can transfer to the field. |
Call for Papers |
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Topics of interest include (but not limited to):
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Summary |
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ITC 2020 : International Test Conference will take place in Washington DC, USA. It’s a 3 days event starting on Nov 03, 2020 (Tuesday) and will be winded up on Nov 05, 2020 (Thursday). ITC 2020 falls under the following areas: TEST, DESIGN, etc. Submissions for this Conference can be made by May 01, 2020. Authors can expect the result of submission by Jun 29, 2020. Upon acceptance, authors should submit the final version of the manuscript on or before Aug 14, 2020 to the official website of the Conference. Please check the official event website for possible changes before you make any travelling arrangements. Generally, events are strict with their deadlines. It is advisable to check the official website for all the deadlines. Other Details of the ITC 2020
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Credits and Sources |
| [1] ITC 2020 : International Test Conference |
