| Title | Microelectronics Reliability |
| Abbreviation | Microelectron. Reliab. |
| Publication Type | Journal |
| Subject Area, Categories, Scope | Safety, Risk, Reliability and Quality (Q2); Atomic and Molecular Physics, and Optics (Q3); Condensed Matter Physics (Q3); Electrical and Electronic Engineering (Q3); Electronic, Optical and Magnetic Materials (Q3); Nanoscience and Nanotechnology (Q3); Surfaces, Coatings and Films (Q3) |
| h-index | 101 |
| Overall Rank/Ranking | 13355 |
| SCImago Journal Rank (SJR) | 0.364 |
| Impact Score | 1.83 |
| Publisher | Elsevier Ltd. |
| Country | United Kingdom |
| ISSN | 00262714 |
| Best Quartile | Q2 |
| Coverage History | 1962-2022 |
Microelectronics Reliability is a journal covering the technologies/fields/categories related to Safety, Risk, Reliability and Quality (Q2); Atomic and Molecular Physics, and Optics (Q3); Condensed Matter Physics (Q3); Electrical and Electronic Engineering (Q3); Electronic, Optical and Magnetic Materials (Q3); Nanoscience and Nanotechnology (Q3); Surfaces, Coatings and Films (Q3). It is published by Elsevier Ltd.. The overall rank of Microelectronics Reliability is 13355. According to SCImago Journal Rank (SJR), this journal is ranked 0.364. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come. SJR acts as an alternative to the Journal Impact Factor (or an average number of citations received in last 2 years). This journal has an h-index of 101. The best quartile for this journal is Q2.
The ISSN of Microelectronics Reliability journal is 00262714. An International Standard Serial Number (ISSN) is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic. Microelectronics Reliability is cited by a total of 1822 articles during the last 3 years (Preceding 2022).
The Impact IF 2022 of Microelectronics Reliability is 1.83, which is computed in 2023 as per its definition. Microelectronics Reliability IF is increased by a factor of 0.23 and approximate percentage change is 14.38% when compared to preceding year 2021, which shows a rising trend. The impact IF, also denoted as Journal impact score (JIS), of an academic journal is a measure of the yearly average number of citations to recent articles published in that journal. It is based on Scopus data.
Impact IF 2022 of Microelectronics Reliability is 1.83. If the same upward trend persists, Impact IF may rise in 2023 as well.
| Year | Impact IF |
|---|---|
| 2023/2024 | Coming Soon |
| 2022 | 1.83 |
| 2021 | 1.60 |
| 2020 | 1.91 |
| 2019 | 2.05 |
| 2018 | 1.83 |
| 2017 | 1.56 |
| 2016 | 1.60 |
| 2015 | 1.72 |
| 2014 | 2.10 |
Microelectronics Reliability has an h-index of 101. It means 101 articles of this journal have more than 101 number of citations. The h-index is a way of measuring the productivity and citation impact of the publications. The h-index is defined as the maximum value of h such that the given journal/author has published h papers that have each been cited at least h number of times.
The ISSN of Microelectronics Reliability is 00262714. ISSN stands for International Standard Serial Number.
An ISSN is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic.
The overall rank of Microelectronics Reliability is 13355. According to SCImago Journal Rank (SJR), this journal is ranked 0.364. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come.
| Year | SJR |
|---|---|
| 2023/2024 | Coming Soon |
| 2022 | 0.364 |
| 2021 | 0.452 |
| 2020 | 0.445 |
| 2019 | 0.497 |
| 2018 | 0.376 |
| 2017 | 0.388 |
| 2016 | 0.447 |
| 2015 | 0.581 |
| 2014 | 0.572 |
| Year | Ranking |
|---|---|
| 2023/2024 | Coming Soon |
| 2022 | 13355 |
| 2021 | 10967 |
| 2020 | 11119 |
| 2019 | 9841 |
| 2018 | 11832 |
| 2017 | 11165 |
| 2016 | 10142 |
| 2015 | 8127 |
| 2014 | 8015 |
Microelectronics Reliability is published by Elsevier Ltd.. It's publishing house is located in United Kingdom. Coverage history of this journal is as following: 1962-2022. The organization or individual who handles the printing and distribution of printed or digital publications is known as Publisher.
Visit the official website of the journal/conference to check the further details about the call for papers.
The IS0 4 standard abbreviation of Microelectronics Reliability is Microelectron. Reliab.. This abbreviation ('Microelectron. Reliab.') is well recommended and approved for the purpose of indexing, abstraction, referencing and citing goals. It meets all the essential criteria of ISO 4 standard.
ISO 4 (International Organization for Standardization 4) is an international standard that defines a uniform and consistent system for abbreviating serial publication titles and journals.
If your research field is/are related to Safety, Risk, Reliability and Quality (Q2); Atomic and Molecular Physics, and Optics (Q3); Condensed Matter Physics (Q3); Electrical and Electronic Engineering (Q3); Electronic, Optical and Magnetic Materials (Q3); Nanoscience and Nanotechnology (Q3); Surfaces, Coatings and Films (Q3), then please visit the official website of this journal.
The acceptance rate/percentage of any academic journal/conference depends upon many parameters. Some of the critical parameters are listed below.
It is essential to understand that the acceptance rate/rejection rate of papers varies among journals. Some Journals considers all the manuscripts submissions as a basis of acceptance rate computation. On the other hand, few consider the only manuscripts sent for peer review or few even not bother about the accurate maintenance of total submissions. Hence, it can provide a rough estimation only.
The best way to find out the acceptance rate is to reach out to the associated editor or to check the official website of the Journal/Conference.
Microelectronics Reliability latest impact IF is 1.83. It's evaluated in the year 2022. The highest and the lowest impact IF or impact score of this journal are 2.10 (2014) and 1.56 (2017), respectively, in the last 9 years. Moreover, its average IS is 1.8 in the previous 9 years.
The Microelectronics Reliability has an SJR (SCImago Journal Rank) of 0.364, according to the latest data. It is computed in the year 2023. In the past 9 years, this journal has recorded a range of SJR, with the highest being 0.581 in 2015 and the lowest being 0.364 in 2022. Furthermore, the average SJR of the Microelectronics Reliability over the previous 9-year period stands at 1.8.
The latest h-index of the Microelectronics Reliability is 101.
The Microelectronics Reliability is published by the Elsevier Ltd., with its country of publication being the United Kingdom.
The Microelectronics Reliability is currently ranked 13355 out of 27955 Journals, Conferences, and Book Series in the latest ranking. Over the course of the last 9 years, this journal has experienced varying rankings, reaching its highest position of 8015 in 2014 and its lowest position of 13355 in 2022.
The standard ISO4 abbreviation for the Microelectronics Reliability is Microelectron. Reliab..
Microelectronics Reliability is classified as a journal that the Elsevier Ltd. publishes.
The Microelectronics Reliability encompasses the following areas:
For a more comprehensive understanding of its scope, check the official website of this journal.
The Microelectronics Reliability is assigned the following International Standard Serial Numbers (ISSN): 00262714.
The best quartile for the Microelectronics Reliability is Q2 (2022).
The Microelectronics Reliability coverage history can be summarized as follows: 1962-2022.
| Journal/Conference/Workshop/Book Title | Type | Ranking | Publisher | h-index | Impact Score |
|---|---|---|---|---|---|
| Syntax | journal | 3422 | Wiley-Blackwell Publishing Ltd | 29 | 0.93 |
| Journal des Professionnels de l'Enfance | journal | 27577 | TPMA | 2 | 0.00 |
| Genes and Nutrition | journal | 6154 | BioMed Central Ltd. | 61 | 3.28 |
| Proceedings of the Royal Society of Queensland | journal | 22998 | Royal Society of Queensland | 12 | 0.48 |
| Journal of Imaging Science and Technology | journal | 19249 | Society for Imaging Science and Technology | 44 | 0.96 |
| Journal of Evolutionary Psychology | journal | 28897 | Akademiai Kiado | 0 | 0.00 |
| Revista de Metodos Cuantitativos para la Economia y la Empresa | journal | 22138 | Universidad Pablo de Olavide | 10 | 0.37 |
| PLoS ONE | journal | 5108 | Public Library of Science | 404 | 3.75 |
| Expert Review of Obstetrics and Gynecology | journal | 17060 | Expert Reviews Ltd. | 21 | 0.00 |
| Journal of Tissue Engineering and Regenerative Medicine | journal | 7762 | John Wiley and Sons Ltd | 85 | 3.55 |
| Year | Impact Score (IS) |
|---|---|
| 2023/2024 | Coming Soon |
| 2022 | 1.83 |
| 2021 | 1.60 |
| 2020 | 1.91 |
| 2019 | 2.05 |
| 2018 | 1.83 |
| 2017 | 1.56 |
| 2016 | 1.60 |
| 2015 | 1.72 |
| 2014 | 2.10 |
