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IEEE International Test Conference (TC)- Impact Score, Overall Ranking, h-index, SJR, Rating, Publisher, ISSN, and Other Important Metrics

Last Updated on May 27, 2022

Impact Score

0.78

h-Index

 81

Rank

 11144

SJR

 0.442

Note: The impact score shown here is equivalent to the average number of times documents published in a journal/conference in the past two years have been cited in the current year (i.e., Cites / Doc. (2 years)). It is based on Scopus data and can be a little higher or different compared to the impact factor (IF) produced by Journal Citation Report. Please refer to the Web of Science data source to check the exact journal impact factor ™ (Thomson Reuters) metric.

Important Metrics

Title IEEE International Test Conference (TC)
Abbreviation IEEE Int. Test Conf. (TC)
Publication Type Conference and proceedings
Subject Area, Categories, Scope Applied Mathematics; Electrical and Electronic Engineering
h-index 81
Overall Rank/Ranking 11144
SCImago Journal Rank (SJR) 0.442
Impact Score 0.78
Publisher Institute of Electrical and Electronics Engineers Inc.
Country United States
ISSN 10893539




About IEEE International Test Conference (TC)


IEEE International Test Conference (TC) is a conference and proceedings covering the technologies/fields/categories related to Applied Mathematics; Electrical and Electronic Engineering. It is published by Institute of Electrical and Electronics Engineers Inc.. The overall rank of IEEE International Test Conference (TC) is 11144. According to SCImago Journal Rank (SJR), this conference and proceedings is ranked 0.442. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come. SJR acts as an alternative to the Journal Impact Factor (or an average number of citations received in last 2 years). This conference and proceedings has an h-index of 81. The best quartile for this conference and proceedings is -.

The ISSN of IEEE International Test Conference (TC) conference and proceedings is 10893539. An International Standard Serial Number (ISSN) is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic. IEEE International Test Conference (TC) is cited by a total of 162 articles during the last 3 years (Preceding 2021).


IEEE International Test Conference (TC) Impact Score 2021-2022


The impact score (IS) 2021 of IEEE International Test Conference (TC) is 0.78, which is computed in 2022 as per its definition. The impact score (IS), also denoted as Journal impact score (JIS), of an academic journal is a measure of the yearly average number of citations to recent articles published in that journal. It is based on Scopus data.

Table Setting


Impact Score Trend


Year wise Impact Score (IS) of IEEE International Test Conference (TC). Based on Scopus data.


Year Impact Score (IS)
2022/2023 Coming Soon
2021 0.78
2020 0.57
2019 1.72
2018 0.82
2017 0.86
2016 0.71
2015 1.78
2014 1.03

IEEE International Test Conference (TC) h-index


  Table Setting

IEEE International Test Conference (TC) has an h-index of 81. It means 81 articles of this conference and proceedings have more than 81 number of citations. The h-index is a way of measuring the productivity and citation impact of the publications. The h-index is defined as the maximum value of h such that the given journal/author has published h papers that have each been cited at least h number of times.




IEEE International Test Conference (TC) ISSN


The ISSN of IEEE International Test Conference (TC) is 10893539. ISSN stands for International Standard Serial Number.

An ISSN is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic.

Table Setting

IEEE International Test Conference (TC) Rank and SCImago Journal Rank (SJR)


The overall rank of IEEE International Test Conference (TC) is 11144. According to SCImago Journal Rank (SJR), this conference and proceedings is ranked 0.442. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come.


IEEE International Test Conference (TC) Publisher


Table Setting

IEEE International Test Conference (TC) is published by Institute of Electrical and Electronics Engineers Inc.. It's publishing house is located in United States. Coverage history of this conference and proceedings is as following: 1989, 1992, 1995-2013, 2015-2017, 2019-2020. The organization or individual who handles the printing and distribution of printed or digital publications is known as Publisher.


Call For Papers


Visit the official website of the journal/conference to check the further details about the call for papers.


Abbreviation


The IS0 4 standard abbreviation of IEEE International Test Conference (TC) is IEEE Int. Test Conf. (TC). This abbreviation ('IEEE Int. Test Conf. (TC)') is well recommended and approved for the purpose of indexing, abstraction, referencing and citing goals. It meets all the essential criteria of ISO 4 standard.

ISO 4 (International Organization for Standardization 4) is an international standard that defines a uniform and consistent system for abbreviating serial publication titles and journals.


How to publish in IEEE International Test Conference (TC)


If your research field is/are related to Applied Mathematics; Electrical and Electronic Engineering, then please visit the official website of this conference and proceedings.


Acceptance Rate


The acceptance rate/percentage of any academic journal/conference depends upon many parameters. Some of the critical parameters are listed below.

  • The demand or interest of researchers/scientists in publishing in a specific Journal/Conference.
  • Peer review complexity and timeline.
  • The mix of unsolicited and invited submissions.
  • The time it takes from manuscript submission to final publication.
  • And Many More.

It is essential to understand that the acceptance rate/rejection rate of papers varies among journals. Some Journals considers all the manuscripts submissions as a basis of acceptance rate computation. On the other hand, few consider the only manuscripts sent for peer review or few even not bother about the accurate maintenance of total submissions. Hence, it can provide a rough estimation only.

The best way to find out the acceptance rate is to reach out to the associated editor or to check the official website of the Journal/Conference.


Credits and Sources


  • Scimago Journal & Country Rank (SJR), https://www.scimagojr.com/
  • Journal Impact Factor, https://clarivate.com/



Impact Score, h-Index, and Other Important Details of These Journals, Conferences, and Books


Journal/Conference/Workshop/Book Title Type Ranking Publisher h-index Impact Score
Scottish Medical Journal journal 15022 SAGE Publications Inc. 27 1.65
Ultramicroscopy journal 2856 Elsevier 127 2.91
Biology Open journal 6105 Company of Biologists Ltd 47 2.33
Mining of Mineral Deposits journal 9584 Dnipro University of Technology 14 2.01
Boletin de Filologia journal 16262 Universidad de Chile 8 0.30
Representation Theory journal 7270 American Mathematical Society 33 0.50
Education Research International journal 13002 Hindawi Limited 11 1.77
Cahiers de Psychologie Clinique journal 25872 Boeck Universite 8 0.06
Archives of Suicide Research journal 5644 Routledge 54 2.60
Cancer Communications journal 940 John Wiley & Sons Inc. 60 9.09

Check complete list




Year wise Impact Score (IS) of IEEE International Test Conference (TC)

Impact Score Table

Year Impact Score (IS)
2022/2023 Coming Soon
2021 0.78
2020 0.57
2019 1.72
2018 0.82
2017 0.86
2016 0.71
2015 1.78
2014 1.03



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