| Title | Experience of Designing and Application of CAD Systems in Microelectronics |
| Abbreviation | Exp. Des. Appl. CAD Syst. Microelectron. |
| Publication Type | Journal |
| Subject Area, Categories, Scope | Computer Graphics and Computer-Aided Design (Q4); Computer Science Applications (Q4); Electrical and Electronic Engineering (Q4); Modeling and Simulation (Q4); Safety, Risk, Reliability and Quality (Q4); Software (Q4) |
| h-index | 13 |
| Overall Rank/Ranking | 24466 |
| SCImago Journal Rank (SJR) | 0.151 |
| Impact Score | 0.00 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Country | United States |
| ISSN | 25727591 |
| Best Quartile | Q4 |
| Coverage History | 2019, 2021 |
Experience of Designing and Application of CAD Systems in Microelectronics is a journal covering the technologies/fields/categories related to Computer Graphics and Computer-Aided Design (Q4); Computer Science Applications (Q4); Electrical and Electronic Engineering (Q4); Modeling and Simulation (Q4); Safety, Risk, Reliability and Quality (Q4); Software (Q4). It is published by Institute of Electrical and Electronics Engineers Inc.. The overall rank of Experience of Designing and Application of CAD Systems in Microelectronics is 24466. According to SCImago Journal Rank (SJR), this journal is ranked 0.151. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come. SJR acts as an alternative to the Journal Impact Factor (or an average number of citations received in last 2 years). This journal has an h-index of 13. The best quartile for this journal is Q4.
The ISSN of Experience of Designing and Application of CAD Systems in Microelectronics journal is 25727591. An International Standard Serial Number (ISSN) is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic. Experience of Designing and Application of CAD Systems in Microelectronics is cited by a total of 32 articles during the last 3 years (Preceding 2024).
The Impact IF 2024 of Experience of Designing and Application of CAD Systems in Microelectronics is 0.00, which is computed in 2025 as per its definition. The impact IF, also denoted as Journal impact score (JIS), of an academic journal is a measure of the yearly average number of citations to recent articles published in that journal. It is based on Scopus data.
Impact IF 2024 of Experience of Designing and Application of CAD Systems in Microelectronics is 0.00. If the same upward trend persists, Impact IF may rise in 2025 as well.
| Year | Impact IF |
|---|---|
| 2025/2026 | Coming Soon |
| 2024 | 0.00 |
Experience of Designing and Application of CAD Systems in Microelectronics has an h-index of 13. It means 13 articles of this journal have more than 13 number of citations. The h-index is a way of measuring the productivity and citation impact of the publications. The h-index is defined as the maximum value of h such that the given journal/author has published h papers that have each been cited at least h number of times.
The ISSN of Experience of Designing and Application of CAD Systems in Microelectronics is 25727591. ISSN stands for International Standard Serial Number.
An ISSN is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic.
The overall rank of Experience of Designing and Application of CAD Systems in Microelectronics is 24466. According to SCImago Journal Rank (SJR), this journal is ranked 0.151. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come.
| Year | SJR |
|---|---|
| 2025/2026 | Coming Soon |
| 2024 | 0.151 |
| Year | Ranking |
|---|---|
| 2025/2026 | Coming Soon |
| 2024 | 24466 |
Experience of Designing and Application of CAD Systems in Microelectronics is published by Institute of Electrical and Electronics Engineers Inc.. It's publishing house is located in United States. Coverage history of this journal is as following: 2019, 2021. The organization or individual who handles the printing and distribution of printed or digital publications is known as Publisher.
Visit the official website of the journal/conference to check the further details about the call for papers.
The IS0 4 standard abbreviation of Experience of Designing and Application of CAD Systems in Microelectronics is Exp. Des. Appl. CAD Syst. Microelectron.. This abbreviation ('Exp. Des. Appl. CAD Syst. Microelectron.') is well recommended and approved for the purpose of indexing, abstraction, referencing and citing goals. It meets all the essential criteria of ISO 4 standard.
ISO 4 (International Organization for Standardization 4) is an international standard that defines a uniform and consistent system for abbreviating serial publication titles and journals.
If your research field is/are related to Computer Graphics and Computer-Aided Design (Q4); Computer Science Applications (Q4); Electrical and Electronic Engineering (Q4); Modeling and Simulation (Q4); Safety, Risk, Reliability and Quality (Q4); Software (Q4), then please visit the official website of this journal.
The acceptance rate/percentage of any academic journal/conference depends upon many parameters. Some of the critical parameters are listed below.
It is essential to understand that the acceptance rate/rejection rate of papers varies among journals. Some Journals considers all the manuscripts submissions as a basis of acceptance rate computation. On the other hand, few consider the only manuscripts sent for peer review or few even not bother about the accurate maintenance of total submissions. Hence, it can provide a rough estimation only.
The best way to find out the acceptance rate is to reach out to the associated editor or to check the official website of the Journal/Conference.
Experience of Designing and Application of CAD Systems in Microelectronics latest impact IF is 0.00. It's evaluated in the year 2024. The highest and the lowest impact IF or impact score of this journal are 0.00 (2024) and 0.00 (2024), respectively, in the last 1 year. Moreover, its average IS is 0 in the previous 1 year.
The Experience of Designing and Application of CAD Systems in Microelectronics has an SJR (SCImago Journal Rank) of 0.151, according to the latest data. It is computed in the year 2025. In the past 1 years, this journal has recorded a range of SJR, with the highest being 0.151 in 2024 and the lowest being 0.151 in 2024. Furthermore, the average SJR of the Experience of Designing and Application of CAD Systems in Microelectronics over the previous 1-year period stands at 0.
The latest h-index of the Experience of Designing and Application of CAD Systems in Microelectronics is 13.
The Experience of Designing and Application of CAD Systems in Microelectronics is published by the Institute of Electrical and Electronics Engineers Inc., with its country of publication being the United States.
The Experience of Designing and Application of CAD Systems in Microelectronics is currently ranked 24466 out of 27955 Journals, Conferences, and Book Series in the latest ranking. Over the course of the last 1 year, this journal has experienced varying rankings, reaching its highest position of 24466 in 2024 and its lowest position of 24466 in 2024.
The standard ISO4 abbreviation for the Experience of Designing and Application of CAD Systems in Microelectronics is Exp. Des. Appl. CAD Syst. Microelectron..
Experience of Designing and Application of CAD Systems in Microelectronics is classified as a journal that the Institute of Electrical and Electronics Engineers Inc. publishes.
The Experience of Designing and Application of CAD Systems in Microelectronics encompasses the following areas:
For a more comprehensive understanding of its scope, check the official website of this journal.
The Experience of Designing and Application of CAD Systems in Microelectronics is assigned the following International Standard Serial Numbers (ISSN): 25727591.
The best quartile for the Experience of Designing and Application of CAD Systems in Microelectronics is Q4 (2024).
The Experience of Designing and Application of CAD Systems in Microelectronics coverage history can be summarized as follows: 2019, 2021.
| Journal/Conference/Workshop/Book Title | Type | Ranking | Publisher | h-index | Impact Score |
|---|---|---|---|---|---|
| Dermatologia Kliniczna | journal | 25442 | Cornetis | 7 | 0.00 |
| Journal of International Financial Management and Accounting | journal | 1434 | Wiley-Blackwell Publishing Ltd | 50 | 10.53 |
| Air and Space Power Journal (discontinued) | journal | 28397 | AU Press | 9 | 0.20 |
| Discourse | journal | 7536 | Routledge | 70 | 2.75 |
| Modern Language Journal | journal | 1033 | Wiley-Blackwell | 123 | 3.95 |
| Educational Measurement: Issues and Practice | journal | 6760 | Wiley-Blackwell Publishing Ltd | 68 | 1.54 |
| Proceedings of the International Semiconductor Conference, CAS | conference and proceedings | 25734 | Institute of Electrical and Electronics Engineers Inc. | 16 | 0.00 |
| Biological Procedures Online | journal | 5232 | BioMed Central Ltd | 51 | 4.00 |
| Journal of Imaging Science and Technology | journal | 22021 | Society for Imaging Science and Technology | 45 | 0.61 |
| Proceedings of the ACM SIGKDD International Conference on Knowledge Discovery and Data Mining | conference and proceedings | 4334 | 192 | 0.00 |
| Year | Impact Score (IS) |
|---|---|
| 2025/2026 | Coming Soon |
| 2024 | 0.00 |
