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2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016- Impact Factor, Overall Ranking, h-index, SJR, Rating, Publisher, ISSN, and Other Important Metrics

Last Updated on October 4, 2021

Impact Score

0.18

h-Index

 1

Rank

 29810

SJR

 0.104

Note: The impact score shown here is equivalent to the average number of times documents published in a journal/conference in the past two years have been cited in the current year (i.e., Cites / Doc. (2 years)). It is based on Scopus data and can be a little higher or different compared to the impact factor (IF) produced by Journal Citation Report. Please refer to the Web of Science data source to check the exact journal impact factor ™ (Thomson Reuters) metric.

Important Metrics

Title 2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016
Abbreviation 2016 Nanotechnol. Instrum. Meas. NANOfIM 2016
Publication Type Conference and proceedings
Subject Area, Categories, Scope Electronic, Optical and Magnetic Materials; Instrumentation
h-index 1
Overall Rank/Ranking 29810
SCImago Journal Rank (SJR) 0.104
Impact Score 0.18
Publisher
Country United States
ISSN -


About 2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016


2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 is a conference and proceedings covering the technologies/fields/categories related to Electronic, Optical and Magnetic Materials; Instrumentation. It is published by . The overall rank of 2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 is 29810. According to SCImago Journal Rank (SJR), this conference and proceedings is ranked 0.104. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come. SJR acts as an alternative to the Journal Impact Factor (or an average number of citations received in last 2 years). This conference and proceedings has an h-index of 1. The best quartile for this conference and proceedings is -.

The ISSN of 2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 conference and proceedings is -. An International Standard Serial Number (ISSN) is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic. 2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 is cited by a total of 3 articles during the last 3 years (Preceding 2020).


2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 Impact Score 2020-2021


The impact score (IS) 2020 of 2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 is 0.18, which is computed in 2021 as per its definition. The impact score (IS), also denoted as Journal impact score (JIS), of an academic journal is a measure of the yearly average number of citations to recent articles published in that journal. It is based on Scopus data.

Table Setting


Impact Score Trend


Year wise Impact Score (IS) of 2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016. Based on Scopus data.


Year Impact Score (IS)
2021/2022 Coming Soon
2020 0.18
2019 ''
2018 0.00
2017 ''
2016 ''
2015 ''
2014 ''

2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 h-index


  Table Setting

2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 has an h-index of 1. It means 1 articles of this conference and proceedings have more than 1 number of citations. The h-index is a way of measuring the productivity and citation impact of the publications. The h-index is defined as the maximum value of h such that the given journal/author has published h papers that have each been cited at least h number of times.




2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 ISSN


The ISSN of 2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 is -. ISSN stands for International Standard Serial Number.

An ISSN is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic.

Table Setting

2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 Rank and SCImago Journal Rank (SJR)


The overall rank of 2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 is 29810. According to SCImago Journal Rank (SJR), this conference and proceedings is ranked 0.104. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come.


2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 Publisher


Table Setting

2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 is published by . It's publishing house is located in United States. Coverage history of this conference and proceedings is as following: 2016. The organization or individual who handles the printing and distribution of printed or digital publications is known as Publisher.


Call For Papers


Visit the official website of the journal/conference to check the further details about the call for papers.


Abbreviation


The IS0 4 standard abbreviation of 2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016 is 2016 Nanotechnol. Instrum. Meas. NANOfIM 2016. This abbreviation ('2016 Nanotechnol. Instrum. Meas. NANOfIM 2016') is well recommended and approved for the purpose of indexing, abstraction, referencing and citing goals. It meets all the essential criteria of ISO 4 standard.

ISO 4 (International Organization for Standardization 4) is an international standard that defines a uniform and consistent system for abbreviating serial publication titles and journals.


How to publish in 2016 Nanotechnology for Instrumentation and Measurement, NANOfIM 2016


If your research field is/are related to Electronic, Optical and Magnetic Materials; Instrumentation, then please visit the official website of this conference and proceedings.


Acceptance Rate


The acceptance rate/percentage of any academic journal/conference depends upon many parameters. Some of the critical parameters are listed below.

  • The demand or interest of researchers/scientists in publishing in a specific Journal/Conference.
  • Peer review complexity and timeline.
  • The mix of unsolicited and invited submissions.
  • The time it takes from manuscript submission to final publication.
  • And Many More.

It is essential to understand that the acceptance rate/rejection rate of papers varies among journals. Some Journals considers all the manuscripts submissions as a basis of acceptance rate computation. On the other hand, few consider the only manuscripts sent for peer review or few even not bother about the accurate maintenance of total submissions. Hence, it can provide a rough estimation only.

The best way to find out the acceptance rate is to reach out to the associated editor or to check the official website of the Journal/Conference.


Credits and Sources


  • Scimago Journal & Country Rank (SJR), https://www.scimagojr.com/
  • Journal Impact Factor, https://clarivate.com/



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