IMPACT SCORE JOURNAL RANKING CONFERENCE RANKING Conferences Journals Workshops Seminars SYMPOSIUMS MEETINGS BLOG LaTeX 5G Tutorial Free Tools

Search About Journals, Conferences, and Book Series

Journal of Electronic Testing: Theory and Applications (JETTA)- Impact Score, Overall Ranking, h-index, SJR, Rating, Publisher, ISSN, and Other Important Metrics

Last Updated on May 27, 2022

Impact Score

0.80

h-Index

 35

Rank

 14050

SJR

 0.325

Note: The impact score shown here is equivalent to the average number of times documents published in a journal/conference in the past two years have been cited in the current year (i.e., Cites / Doc. (2 years)). It is based on Scopus data and can be a little higher or different compared to the impact factor (IF) produced by Journal Citation Report. Please refer to the Web of Science data source to check the exact journal impact factor ™ (Thomson Reuters) metric.

Important Metrics

Title Journal of Electronic Testing: Theory and Applications (JETTA)
Abbreviation J. Electron. Test.: Theory Appl. (JETTA)
Publication Type Journal
Subject Area, Categories, Scope Electrical and Electronic Engineering (Q3)
h-index 35
Overall Rank/Ranking 14050
SCImago Journal Rank (SJR) 0.325
Impact Score 0.80
Publisher Springer Netherlands
Country Netherlands
ISSN 15730727, 09238174




Aim and Scope


The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.

A partial list of topics covered in the journal includes testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.


About Journal of Electronic Testing: Theory and Applications (JETTA)


Journal of Electronic Testing: Theory and Applications (JETTA) is a journal covering the technologies/fields/categories related to Electrical and Electronic Engineering (Q3). It is published by Springer Netherlands. The overall rank of Journal of Electronic Testing: Theory and Applications (JETTA) is 14050. According to SCImago Journal Rank (SJR), this journal is ranked 0.325. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come. SJR acts as an alternative to the Journal Impact Factor (or an average number of citations received in last 2 years). This journal has an h-index of 35. The best quartile for this journal is Q3.

The ISSN of Journal of Electronic Testing: Theory and Applications (JETTA) journal is 15730727, 09238174. An International Standard Serial Number (ISSN) is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic. Journal of Electronic Testing: Theory and Applications (JETTA) is cited by a total of 182 articles during the last 3 years (Preceding 2021).


Journal of Electronic Testing: Theory and Applications (JETTA) Impact Score 2021-2022


The impact score (IS) 2021 of Journal of Electronic Testing: Theory and Applications (JETTA) is 0.80, which is computed in 2022 as per its definition. Journal of Electronic Testing: Theory and Applications (JETTA) IS is decreased by a factor of 0.28 and approximate percentage change is -25.93% when compared to preceding year 2020, which shows a falling trend. The impact score (IS), also denoted as Journal impact score (JIS), of an academic journal is a measure of the yearly average number of citations to recent articles published in that journal. It is based on Scopus data.

Table Setting

Journal of Electronic Testing: Theory and Applications (JETTA) Impact Score 2022 Prediction


IS 2021 of Journal of Electronic Testing: Theory and Applications (JETTA) is 0.80. If the same downward trend persists, impact score may fall in 2022 as well.


Impact Score Trend


Year wise Impact Score (IS) of Journal of Electronic Testing: Theory and Applications (JETTA). Based on Scopus data.


Year Impact Score (IS)
2022/2023 Coming Soon
2021 0.80
2020 1.08
2019 0.90
2018 0.97
2017 0.72
2016 0.82
2015 0.84
2014 0.80

Journal of Electronic Testing: Theory and Applications (JETTA) h-index


  Table Setting

Journal of Electronic Testing: Theory and Applications (JETTA) has an h-index of 35. It means 35 articles of this journal have more than 35 number of citations. The h-index is a way of measuring the productivity and citation impact of the publications. The h-index is defined as the maximum value of h such that the given journal/author has published h papers that have each been cited at least h number of times.




Journal of Electronic Testing: Theory and Applications (JETTA) ISSN


The ISSN of Journal of Electronic Testing: Theory and Applications (JETTA) is 15730727, 09238174. ISSN stands for International Standard Serial Number.

An ISSN is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic.

Table Setting

Journal of Electronic Testing: Theory and Applications (JETTA) Rank and SCImago Journal Rank (SJR)


The overall rank of Journal of Electronic Testing: Theory and Applications (JETTA) is 14050. According to SCImago Journal Rank (SJR), this journal is ranked 0.325. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come.


Journal of Electronic Testing: Theory and Applications (JETTA) Publisher


Table Setting

Journal of Electronic Testing: Theory and Applications (JETTA) is published by Springer Netherlands. It's publishing house is located in Netherlands. Coverage history of this journal is as following: 1990-2021. The organization or individual who handles the printing and distribution of printed or digital publications is known as Publisher.


Call For Papers


Visit the official website of the journal/conference to check the further details about the call for papers.


Abbreviation


The IS0 4 standard abbreviation of Journal of Electronic Testing: Theory and Applications (JETTA) is J. Electron. Test.: Theory Appl. (JETTA). This abbreviation ('J. Electron. Test.: Theory Appl. (JETTA)') is well recommended and approved for the purpose of indexing, abstraction, referencing and citing goals. It meets all the essential criteria of ISO 4 standard.

ISO 4 (International Organization for Standardization 4) is an international standard that defines a uniform and consistent system for abbreviating serial publication titles and journals.


How to publish in Journal of Electronic Testing: Theory and Applications (JETTA)


If your research field is/are related to Electrical and Electronic Engineering (Q3), then please visit the official website of this journal.


Acceptance Rate


The acceptance rate/percentage of any academic journal/conference depends upon many parameters. Some of the critical parameters are listed below.

  • The demand or interest of researchers/scientists in publishing in a specific Journal/Conference.
  • Peer review complexity and timeline.
  • The mix of unsolicited and invited submissions.
  • The time it takes from manuscript submission to final publication.
  • And Many More.

It is essential to understand that the acceptance rate/rejection rate of papers varies among journals. Some Journals considers all the manuscripts submissions as a basis of acceptance rate computation. On the other hand, few consider the only manuscripts sent for peer review or few even not bother about the accurate maintenance of total submissions. Hence, it can provide a rough estimation only.

The best way to find out the acceptance rate is to reach out to the associated editor or to check the official website of the Journal/Conference.


Credits and Sources


  • Scimago Journal & Country Rank (SJR), https://www.scimagojr.com/
  • Journal Impact Factor, https://clarivate.com/



Impact Score, h-Index, and Other Important Details of These Journals, Conferences, and Books


Journal/Conference/Workshop/Book Title Type Ranking Publisher h-index Impact Score
Asia Pacific Issues journal 21408 East-West Center 15 0.20
Journal of Population and Social Studies journal 19693 Mahidol University, Institute for Population and Social Research 5 0.60
Anti-Cancer Drugs journal 10707 Lippincott Williams and Wilkins Ltd. 96 2.27
Remote Sensing journal 2749 Multidisciplinary Digital Publishing Institute (MDPI) 144 5.45
Journal of Structural Geology journal 2706 Elsevier Ltd. 133 3.29
Bulletin of Siberian Medicine journal 23003 Siberian State Medical University 5 0.37
Foreign Affairs journal 10133 Council on Foreign Relations, Inc. 99 2.42
Nursing Education Perspectives journal 10551 Lippincott Williams and Wilkins Ltd. 50 1.08
Journal of Control Science and Engineering journal 14904 Hindawi Publishing Corporation 21 1.69
Archeologia dell'Architettura journal 24673 Edizioni all'Insegna del Giglio s.a.s. 3 0.12

Check complete list




Year wise Impact Score (IS) of Journal of Electronic Testing: Theory and Applications (JETTA)

Impact Score Table

Year Impact Score (IS)
2022/2023 Coming Soon
2021 0.80
2020 1.08
2019 0.90
2018 0.97
2017 0.72
2016 0.82
2015 0.84
2014 0.80



Top Journals/Conferences in Electrical and Electronic Engineering

Nature Nanotechnology
Nature Publishing Group | United Kingdom

Nature Electronics
Nature Publishing Group | United Kingdom

IEEE Communications Surveys and Tutorials
Institute of Electrical and Electronics Engineers Inc. | United States

Nano Energy
Elsevier BV | Netherlands

Materials Horizons
Royal Society of Chemistry | United Kingdom

npj Flexible Electronics
Nature Publishing Group | United Kingdom

Nano-Micro Letters
| Netherlands

Digest of Technical Papers - IEEE International Solid-State Circuits Conference
Institute of Electrical and Electronics Engineers Inc. | United States

IEEE Transactions on Automatic Control
Institute of Electrical and Electronics Engineers Inc. | United States

IEEE Transactions on Power Systems
Institute of Electrical and Electronics Engineers Inc. | United States

See All