| Title | Annual IEEE Semiconductor Thermal Measurement and Management Symposium |
| Abbreviation | Annu. IEEE Semicond. Therm. Meas. Manag. Symp. |
| Publication Type | Conference and proceedings |
| Subject Area, Categories, Scope | Electrical and Electronic Engineering; Instrumentation |
| h-index | 40 |
| Overall Rank/Ranking | 16676 |
| SCImago Journal Rank (SJR) | 0.250 |
| Impact Score | 0.00 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Country | United States |
| ISSN | 10652221 |
| Best Quartile | - |
| Coverage History | 1995-2017 |
Annual IEEE Semiconductor Thermal Measurement and Management Symposium is a conference and proceedings covering the technologies/fields/categories related to Electrical and Electronic Engineering; Instrumentation. It is published by Institute of Electrical and Electronics Engineers Inc.. The overall rank of Annual IEEE Semiconductor Thermal Measurement and Management Symposium is 16676. According to SCImago Journal Rank (SJR), this conference and proceedings is ranked 0.250. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come. SJR acts as an alternative to the Journal Impact Factor (or an average number of citations received in last 2 years). This conference and proceedings has an h-index of 40. The best quartile for this conference and proceedings is -.
The ISSN of Annual IEEE Semiconductor Thermal Measurement and Management Symposium conference and proceedings is 10652221. An International Standard Serial Number (ISSN) is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic. Annual IEEE Semiconductor Thermal Measurement and Management Symposium is cited by a total of 47 articles during the last 3 years (Preceding 2020).
The Impact IF 2020 of Annual IEEE Semiconductor Thermal Measurement and Management Symposium is 0.00, which is computed in 2021 as per its definition. The impact IF, also denoted as Journal impact score (JIS), of an academic journal is a measure of the yearly average number of citations to recent articles published in that journal. It is based on Scopus data.
| Year | Impact IF |
|---|---|
| 2023/2024 | Coming Soon |
| 2020 | 0.00 |
| 2019 | 0.83 |
| 2018 | 0.76 |
| 2017 | 1.04 |
| 2016 | 0.83 |
| 2015 | 0.78 |
| 2014 | 1.11 |
Annual IEEE Semiconductor Thermal Measurement and Management Symposium has an h-index of 40. It means 40 articles of this conference and proceedings have more than 40 number of citations. The h-index is a way of measuring the productivity and citation impact of the publications. The h-index is defined as the maximum value of h such that the given journal/author has published h papers that have each been cited at least h number of times.
The ISSN of Annual IEEE Semiconductor Thermal Measurement and Management Symposium is 10652221. ISSN stands for International Standard Serial Number.
An ISSN is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic.
The overall rank of Annual IEEE Semiconductor Thermal Measurement and Management Symposium is 16676. According to SCImago Journal Rank (SJR), this conference and proceedings is ranked 0.250. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come.
| Year | SJR |
|---|---|
| 2023/2024 | Coming Soon |
| 2020 | 0.250 |
| 2019 | 0.186 |
| 2018 | 0.157 |
| 2017 | 0.243 |
| 2016 | 0.279 |
| 2015 | 0.370 |
| 2014 | 0.324 |
| Year | Ranking |
|---|---|
| 2023/2024 | Coming Soon |
| 2020 | 16676 |
| 2019 | 19342 |
| 2018 | 20710 |
| 2017 | 15313 |
| 2016 | 14181 |
| 2015 | 11551 |
| 2014 | 12312 |
Annual IEEE Semiconductor Thermal Measurement and Management Symposium is published by Institute of Electrical and Electronics Engineers Inc.. It's publishing house is located in United States. Coverage history of this conference and proceedings is as following: 1995-2017. The organization or individual who handles the printing and distribution of printed or digital publications is known as Publisher.
Visit the official website of the journal/conference to check the further details about the call for papers.
The IS0 4 standard abbreviation of Annual IEEE Semiconductor Thermal Measurement and Management Symposium is Annu. IEEE Semicond. Therm. Meas. Manag. Symp.. This abbreviation ('Annu. IEEE Semicond. Therm. Meas. Manag. Symp.') is well recommended and approved for the purpose of indexing, abstraction, referencing and citing goals. It meets all the essential criteria of ISO 4 standard.
ISO 4 (International Organization for Standardization 4) is an international standard that defines a uniform and consistent system for abbreviating serial publication titles and journals.
If your research field is/are related to Electrical and Electronic Engineering; Instrumentation, then please visit the official website of this conference and proceedings.
The acceptance rate/percentage of any academic journal/conference depends upon many parameters. Some of the critical parameters are listed below.
It is essential to understand that the acceptance rate/rejection rate of papers varies among journals. Some Journals considers all the manuscripts submissions as a basis of acceptance rate computation. On the other hand, few consider the only manuscripts sent for peer review or few even not bother about the accurate maintenance of total submissions. Hence, it can provide a rough estimation only.
The best way to find out the acceptance rate is to reach out to the associated editor or to check the official website of the Journal/Conference.
Annual IEEE Semiconductor Thermal Measurement and Management Symposium latest impact IF is 0.00. It's evaluated in the year 2020. The highest and the lowest impact IF or impact score of this conference and proceedings are 1.11 (2014) and 0.00 (2020), respectively, in the last 7 years. Moreover, its average IS is 0.76 in the previous 7 years.
The Annual IEEE Semiconductor Thermal Measurement and Management Symposium has an SJR (SCImago Journal Rank) of 0.250, according to the latest data. It is computed in the year 2021. In the past 7 years, this conference and proceedings has recorded a range of SJR, with the highest being 0.370 in 2015 and the lowest being 0.157 in 2018. Furthermore, the average SJR of the Annual IEEE Semiconductor Thermal Measurement and Management Symposium over the previous 7-year period stands at 0.76.
The latest h-index of the Annual IEEE Semiconductor Thermal Measurement and Management Symposium is 40.
The Annual IEEE Semiconductor Thermal Measurement and Management Symposium is published by the Institute of Electrical and Electronics Engineers Inc., with its country of publication being the United States.
The Annual IEEE Semiconductor Thermal Measurement and Management Symposium is currently ranked 16676 out of 27955 Journals, Conferences, and Book Series in the latest ranking. Over the course of the last 7 years, this conference and proceedings has experienced varying rankings, reaching its highest position of 11551 in 2015 and its lowest position of 20710 in 2018.
The standard ISO4 abbreviation for the Annual IEEE Semiconductor Thermal Measurement and Management Symposium is Annu. IEEE Semicond. Therm. Meas. Manag. Symp..
Annual IEEE Semiconductor Thermal Measurement and Management Symposium is classified as a conference and proceedings that the Institute of Electrical and Electronics Engineers Inc. publishes.
The Annual IEEE Semiconductor Thermal Measurement and Management Symposium encompasses the following areas:
For a more comprehensive understanding of its scope, check the official website of this conference and proceedings.
The Annual IEEE Semiconductor Thermal Measurement and Management Symposium is assigned the following International Standard Serial Numbers (ISSN): 10652221.
The Annual IEEE Semiconductor Thermal Measurement and Management Symposium coverage history can be summarized as follows: 1995-2017.
| Journal/Conference/Workshop/Book Title | Type | Ranking | Publisher | h-index | Impact Score |
|---|---|---|---|---|---|
| Zeitschrift fur Germanistische Linguistik | journal | 22945 | De Gruyter Mouton | 15 | 0.19 |
| Archives of Phytopathology and Plant Protection | journal | 14852 | Taylor and Francis Ltd. | 29 | 1.14 |
| Materials Research | journal | 14791 | Universidade Federal de Sao Carlos | 65 | 1.62 |
| British Journal of Special Education | journal | 12024 | Wiley-Blackwell Publishing Ltd | 42 | 1.24 |
| Journal des Professionnels de l'Enfance | journal | 27577 | TPMA | 2 | 0.00 |
| Engenharia Agricola | journal | 15839 | Sociedade Brasileira de Engenharia Agricola | 30 | 1.12 |
| Poljoprivreda | journal | 20724 | Faculty of Agriculture in Osijek | 14 | 0.67 |
| Journal on Chain and Network Science | journal | 11905 | Wageningen Academic Publishers | 24 | 0.00 |
| Chemical Product and Process Modeling | journal | 20431 | Walter de Gruyter GmbH | 19 | 1.26 |
| Journal of Power Electronics | journal | 14181 | Korean Institute of Power Electronics | 38 | 1.69 |
| Year | Impact Score (IS) |
|---|---|
| 2021/2022 | Coming Soon |
| 2020 | 0.00 |
| 2019 | 0.83 |
| 2018 | 0.76 |
| 2017 | 1.04 |
| 2016 | 0.83 |
| 2015 | 0.78 |
| 2014 | 1.11 |
