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VALID 2021 : The Thirteenth International Conference on Advances in System Testing and Validation Lifecycle
VALID 2021 : The Thirteenth International Conference on Advances in System Testing and Validation Lifecycle

VALID 2021 : The Thirteenth International Conference on Advances in System Testing and Validation Lifecycle

Barcelona, Spain
Event Date: October 03, 2021 - October 07, 2021
Submission Deadline: July 05, 2021
Notification of Acceptance: August 14, 2021
Camera Ready Version Due: September 04, 2021




About

VALID 2021 conference tracks:

Trends and achievements

Testing and validating Industry 4.0 applications; Testing and validating Internet of Things (IoT) systems; Big Datasets validation; Validate patch generation systems; Automation in defect prediction models; Automated test suite for time-continuous models; Learning semantics for defect prediction; Variability and bug-finding; Mining sandboxes; Validation confidence quantification; Validating mission-critical applications; Validating accessibility requirements; Validation prediction-oriented applications;  Validation of high-risk applications and systems; Testing and validation of Internet of Vehicle (IoV) systems

Robust design methodologies

Designing methodologies for robust systems; Secure software techniques; Industrial real-time software; Defect avoidance; Cost models for robust systems; Design for testability; Design for reliability and variability; Design for adaptation and resilience; Design for fault-tolerance and fast recovery; Design for manufacturability, yield and reliability; Design for testability in the context of model-driven engineering

Vulnerability discovery and resolution

Vulnerability assessment; On-line error detection; Vulnerabilities in hardware security; Self-calibration; Alternative inspections; Non-intrusive vulnerability discovery methods; Embedded malware detection

Defects and Debugging

Debugging techniques; Component debug; System debug; Software debug; Hardware debug; System debug; Power-ground defects; Full-open defects in interconnecting lines; Physical defects in memories and microprocessors; Zero-defect principles

Diagnosis

Diagnosis techniques; Advances in silicon debug and diagnosis; Error diagnosis; History-based diagnosis; Multiple-defect diagnosis; Optical diagnostics; Testability and diagnosability; Diagnosis and testing in mobile environments

......



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Summary

VALID 2021 : The Thirteenth International Conference on Advances in System Testing and Validation Lifecycle will take place in Barcelona, Spain. It’s a 5 days event starting on Oct 03, 2021 (Sunday) and will be winded up on Oct 07, 2021 (Thursday).

VALID 2021 falls under the following areas: TESTING, VALIDATION, DESIGN, etc. Submissions for this Conference can be made by Jul 05, 2021. Authors can expect the result of submission by Aug 14, 2021. Upon acceptance, authors should submit the final version of the manuscript on or before Sep 04, 2021 to the official website of the Conference.

Please check the official event website for possible changes before you make any travelling arrangements. Generally, events are strict with their deadlines. It is advisable to check the official website for all the deadlines.

Other Details of the VALID 2021

  • Short Name: VALID 2021
  • Full Name: The Thirteenth International Conference on Advances in System Testing and Validation Lifecycle
  • Timing: 09:00 AM-06:00 PM (expected)
  • Fees: Check the official website of VALID 2021
  • Event Type: Conference
  • Website Link: https://www.iaria.org/conferences2021/VALID21.html
  • Location/Address: Barcelona, Spain


Credits and Sources

[1] VALID 2021 : The Thirteenth International Conference on Advances in System Testing and Validation Lifecycle


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