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Call for Papers |
The 6th IEEE International Conference on Artificial Intelligence Testing (AITEST 2024) covers topics such as:
• Methodologies for testing, verification and validation of AI applications • Testing AI applications • Tools and environment for automated and semi-automated software testing AI applications for various testing activities and management of testing resources • Techniques for testing AI applications • Applications of AI techniques to software testing • Specific concerns of software testing with various specific types of AI technologies and AI applications • Constraint Programming for test case generation and test suite reduction • Machine learning applications to software testing, such as test case generation, test effectiveness prediction and optimization, test adequacy improvement, test cost reduction, etc • Crowdsourcing and swarm intelligence in software testing • Constraint Scheduling and Optimization for test case prioritization and test execution scheduling • Data quality evaluation for AI applications • Genetic algorithms, search-based techniques and heuristics to optimization of testing • Quality assurance for unstructured training data • Automatic data validation tools • Techniques for testing deep neural network learning, reinforcement learning and graph learning • Large-scale unstructured data quality certification |
Summary |
IEEE AITest 2024 : IEEE AITest 2024 – The 6th IEEE International Conference on Artificial Intelligence Testing will take place in China. It’s a 4 days event starting on Jul 15, 2024 (Monday) and will be winded up on Jul 18, 2024 (Thursday). IEEE AITest 2024 falls under the following areas: etc. Please check the official event website for possible changes before you make any travelling arrangements. Generally, events are strict with their deadlines. It is advisable to check the official website for all the deadlines. Other Details of the IEEE AITest 2024
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Credits and Sources |
[1] IEEE AITest 2024 : IEEE AITest 2024 – The 6th IEEE International Conference on Artificial Intelligence Testing |