VALID 2020 : The Twelfth International Conference on Advances in System Testing and Validation Lifecycle

VALID 2020 conference tracks:

Trends and achievements

Testing and validating Industry 4.0 applications; Testing and validating Internet of Things (IoT) systems; Big Datasets validation; Validate patch generation systems; Automation in defect prediction models; Automated test suite for time-continuous models; Learning semantics for defect prediction; Variability and bug-finding; Mining sandboxes; Validation confidence quantification; Validating mission-critical applications; Validating accessibility requirements; Validation prediction-oriented applications;  Validation of high-risk applications and systems; Testing and validation of Internet of Vehicle (IoV) systems

Robust design methodologies

Designing methodologies for robust systems; Secure software techniques; Industrial real-time software; Defect avoidance; Cost models for robust systems; Design for testability; Design for reliability and variability; Design for adaptation and resilience; Design for fault-tolerance and fast recovery; Design for manufacturability, yield and reliability; Design for testability in the context of model-driven engineering

Vulnerability discovery and resolution

Vulnerability assessment; On-line error detection; Vulnerabilities in hardware security; Self-calibration; Alternative inspections; Non-intrusive vulnerability discovery methods; Embedded malware detection

Defects and Debugging

Debugging techniques; Component debug; System debug; Software debug; Hardware debug; System debug; Power-ground defects; Full-open defects in interconnecting lines; Physical defects in memories and microprocessors; Zero-defect principles

Diagnosis

Diagnosis techniques; Advances in silicon debug and diagnosis; Error diagnosis; History-based diagnosis; Multiple-defect diagnosis; Optical diagnostics; Testability and diagnosability; Diagnosis and testing in mo bile environments

System and feature testing

Test strategy for systems-in-package; Testing embedded systems; Testing high-speed systems; Testing delay and performance; Testing communication traffic and QoS/SLA metrics; Testing robustness; Software testing; Hardware testing; Supply-chain testing; Memory testing; Microprocessor testing; Mixed-signal production test; Testing multi-voltage domains; Interconnection and compatibility testing; SAT procedures for application to testing and formal verification

Testing techniques and mechanisms

Fundamentals for digital and analog testing; Emerging testing methodologies; Engineering test coverage; Designing testing suites; Statistical testing; Functional testing; Parametric testing; Defect- and data-driven testing; Automated testing; Embedded testing; Autonomous self-testing; Low cost testing; Optimized testing; Testing systems and devices; Test standards

Testing of wireless communications systems

Testing of mobile wireless communication systems; Testing of wireless sensor networks; Testing of radio-frequency identification systems; Testing of ad-hoc networks; Testing methods for emerging standards; Hardware-based prototyping of wireless communication systems; Physical layer performance verification; On-chip testing of wireless communication systems; Modeling and simulation of wireless channels; Noise characterization and validation; Case studies and industrial applications of test instruments;

Software verification and validation

High-speed interface verification and fault-analysis; Software testing theory and practice; Model-based testing; Verification metrics; Service/application specific testing; Model checking; OO software testing; Testing embedded software; Quality assurance; Empirical studies for verification and validation; Software inspection techniques; Software testing tools; New approaches for software reliability verification and validation

Quality-assessment of software architectures and legacy systems

Quality-Assessment of Software Architectures and Legacy systems; Quality-assessment of software architectures; Validation and verification of software architecture; Automatic analysis of legacy code; Strategies for isolating legacy code and improving the design quality; Metrics for evaluating architectural quality characteristics; Tools for quality assessments of software architectures; Techniques and tools for testing legacy systems

Testing and validation of run-time evolving systems

Automated testing for run-time evolving systems; Testing and validation of evolving systems; Testing and validation of self-controlled systems; Testing compile-time versus run-time dependency for evolving systems; On-line validation and testing of evolving at run-time systems; Modeling for testability of evolving at run-time systems; Near real-time and real-time monitoring of run-time evolving systems; Verification and validation of reflective models for testing; Verification and validation of fault tolerance in run-time evolving systems

Feature-oriented testing

Testing user interfaces and user-driven features; Privacy testing; Ontology accuracy testing; Testing semantic matching; Testing certification processes; Testing authentication mechanisms; Testing biometrics methodologies and mechanisms; Testing cross-nation systems; Testing system interoperability; Testing system safety; Testing system robustness; Testing temporal constraints; Testing transaction-based properties; Directed energy test capabilities /microwave, laser, etc./; Testing delay and latency metrics

Domain-oriented testing

Testing autonomic and autonomous systems;  Testing intrusion prevention systems; Firewall testing;  Information assurance testing; Testing social network systems; Testing recommender systems; Testing biometric systems;  Testing diagnostic systems; Testing on-line systems; Testing financial systems; Testing life threatening systems; Testing emergency systems; Testing sensor-based systems;  Testing testing systems

VALID 2020 : The Twelfth International Conference on Advances in System Testing and Validation Lifecycle will take place in Porto, Portugal. It’s a 5 days event starting on Oct 18, 2020 (Sunday) and will be winded up on Oct 22, 2020 (Thursday).

VALID 2020 falls under the following areas: SYSTEMS, TESTING, VALIDATION, DESIGN, etc. Submissions for this Conference can be made by Jun 27, 2020. Authors can expect the result of submission by Aug 09, 2020. Upon acceptance, authors should submit the final version of the manuscript on or before Sep 03, 2020 to the official website of the Conference.

Please check the official event website for possible changes before you make any travelling arrangements. Generally, events are strict with their deadlines. It is advisable to check the official website for all the deadlines.

Other Details of the VALID 2020

• Short Name: VALID 2020
• Full Name: The Twelfth International Conference on Advances in System Testing and Validation Lifecycle
• Timing: 09:00 AM-06:00 PM (expected)
• Fees: Check the official website of VALID 2020
• Event Type: Conference
• Website Link: https://www.iaria.org/conferences2020/VALID20.html
• Location/Address: Porto, Portugal