| Title | IEEE Transactions on Device and Materials Reliability |
| Abbreviation | IEEE Trans. Device Mater. Reliab. |
| Publication Type | Journal |
| Subject Area, Categories, Scope | Safety, Risk, Reliability and Quality (Q2); Electrical and Electronic Engineering (Q3); Electronic, Optical and Magnetic Materials (Q3) |
| h-index | 75 |
| Overall Rank/Ranking | 12451 |
| SCImago Journal Rank (SJR) | 0.401 |
| Impact Score | 2.14 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Country | United States |
| ISSN | 15304388 |
| Best Quartile | Q2 |
| Coverage History | 2001-2022 |
IEEE Transactions on Device and Materials Reliability is a journal covering the technologies/fields/categories related to Safety, Risk, Reliability and Quality (Q2); Electrical and Electronic Engineering (Q3); Electronic, Optical and Magnetic Materials (Q3). It is published by Institute of Electrical and Electronics Engineers Inc.. The overall rank of IEEE Transactions on Device and Materials Reliability is 12451. According to SCImago Journal Rank (SJR), this journal is ranked 0.401. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come. SJR acts as an alternative to the Journal Impact Factor (or an average number of citations received in last 2 years). This journal has an h-index of 75. The best quartile for this journal is Q2.
The ISSN of IEEE Transactions on Device and Materials Reliability journal is 15304388. An International Standard Serial Number (ISSN) is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic. IEEE Transactions on Device and Materials Reliability is cited by a total of 625 articles during the last 3 years (Preceding 2022).
The Impact IF 2022 of IEEE Transactions on Device and Materials Reliability is 2.14, which is computed in 2023 as per its definition. IEEE Transactions on Device and Materials Reliability IF is increased by a factor of 0.25 and approximate percentage change is 13.23% when compared to preceding year 2021, which shows a rising trend. The impact IF, also denoted as Journal impact score (JIS), of an academic journal is a measure of the yearly average number of citations to recent articles published in that journal. It is based on Scopus data.
Impact IF 2022 of IEEE Transactions on Device and Materials Reliability is 2.14. If the same upward trend persists, Impact IF may rise in 2023 as well.
| Year | Impact IF |
|---|---|
| 2023/2024 | Coming Soon |
| 2022 | 2.14 |
| 2021 | 1.89 |
| 2020 | 2.06 |
| 2019 | 1.99 |
| 2018 | 1.84 |
| 2017 | 1.69 |
| 2016 | 1.89 |
| 2015 | 2.22 |
| 2014 | 2.56 |
IEEE Transactions on Device and Materials Reliability has an h-index of 75. It means 75 articles of this journal have more than 75 number of citations. The h-index is a way of measuring the productivity and citation impact of the publications. The h-index is defined as the maximum value of h such that the given journal/author has published h papers that have each been cited at least h number of times.
The ISSN of IEEE Transactions on Device and Materials Reliability is 15304388. ISSN stands for International Standard Serial Number.
An ISSN is a unique code of 8 digits. It is used for the recognition of journals, newspapers, periodicals, and magazines in all kind of forms, be it print-media or electronic.
The overall rank of IEEE Transactions on Device and Materials Reliability is 12451. According to SCImago Journal Rank (SJR), this journal is ranked 0.401. SCImago Journal Rank is an indicator, which measures the scientific influence of journals. It considers the number of citations received by a journal and the importance of the journals from where these citations come.
| Year | SJR |
|---|---|
| 2023/2024 | Coming Soon |
| 2022 | 0.401 |
| 2021 | 0.458 |
| 2020 | 0.384 |
| 2019 | 0.416 |
| 2018 | 0.381 |
| 2017 | 0.440 |
| 2016 | 0.444 |
| 2015 | 0.729 |
| 2014 | 0.825 |
| Year | Ranking |
|---|---|
| 2023/2024 | Coming Soon |
| 2022 | 12451 |
| 2021 | 10834 |
| 2020 | 12499 |
| 2019 | 11425 |
| 2018 | 11712 |
| 2017 | 10183 |
| 2016 | 10204 |
| 2015 | 6530 |
| 2014 | 5512 |
IEEE Transactions on Device and Materials Reliability is published by Institute of Electrical and Electronics Engineers Inc.. It's publishing house is located in United States. Coverage history of this journal is as following: 2001-2022. The organization or individual who handles the printing and distribution of printed or digital publications is known as Publisher.
Visit the official website of the journal/conference to check the further details about the call for papers.
The IS0 4 standard abbreviation of IEEE Transactions on Device and Materials Reliability is IEEE Trans. Device Mater. Reliab.. This abbreviation ('IEEE Trans. Device Mater. Reliab.') is well recommended and approved for the purpose of indexing, abstraction, referencing and citing goals. It meets all the essential criteria of ISO 4 standard.
ISO 4 (International Organization for Standardization 4) is an international standard that defines a uniform and consistent system for abbreviating serial publication titles and journals.
If your research field is/are related to Safety, Risk, Reliability and Quality (Q2); Electrical and Electronic Engineering (Q3); Electronic, Optical and Magnetic Materials (Q3), then please visit the official website of this journal.
The acceptance rate/percentage of any academic journal/conference depends upon many parameters. Some of the critical parameters are listed below.
It is essential to understand that the acceptance rate/rejection rate of papers varies among journals. Some Journals considers all the manuscripts submissions as a basis of acceptance rate computation. On the other hand, few consider the only manuscripts sent for peer review or few even not bother about the accurate maintenance of total submissions. Hence, it can provide a rough estimation only.
The best way to find out the acceptance rate is to reach out to the associated editor or to check the official website of the Journal/Conference.
IEEE Transactions on Device and Materials Reliability latest impact IF is 2.14. It's evaluated in the year 2022. The highest and the lowest impact IF or impact score of this journal are 2.56 (2014) and 1.69 (2017), respectively, in the last 9 years. Moreover, its average IS is 2.03 in the previous 9 years.
The IEEE Transactions on Device and Materials Reliability has an SJR (SCImago Journal Rank) of 0.401, according to the latest data. It is computed in the year 2023. In the past 9 years, this journal has recorded a range of SJR, with the highest being 0.825 in 2014 and the lowest being 0.381 in 2018. Furthermore, the average SJR of the IEEE Transactions on Device and Materials Reliability over the previous 9-year period stands at 2.03.
The latest h-index of the IEEE Transactions on Device and Materials Reliability is 75.
The IEEE Transactions on Device and Materials Reliability is published by the Institute of Electrical and Electronics Engineers Inc., with its country of publication being the United States.
The IEEE Transactions on Device and Materials Reliability is currently ranked 12451 out of 27955 Journals, Conferences, and Book Series in the latest ranking. Over the course of the last 9 years, this journal has experienced varying rankings, reaching its highest position of 5512 in 2014 and its lowest position of 12499 in 2020.
The standard ISO4 abbreviation for the IEEE Transactions on Device and Materials Reliability is IEEE Trans. Device Mater. Reliab..
IEEE Transactions on Device and Materials Reliability is classified as a journal that the Institute of Electrical and Electronics Engineers Inc. publishes.
The IEEE Transactions on Device and Materials Reliability encompasses the following areas:
For a more comprehensive understanding of its scope, check the official website of this journal.
The IEEE Transactions on Device and Materials Reliability is assigned the following International Standard Serial Numbers (ISSN): 15304388.
The best quartile for the IEEE Transactions on Device and Materials Reliability is Q2 (2022).
The IEEE Transactions on Device and Materials Reliability coverage history can be summarized as follows: 2001-2022.
| Journal/Conference/Workshop/Book Title | Type | Ranking | Publisher | h-index | Impact Score |
|---|---|---|---|---|---|
| Journal of Business Economics and Management | journal | 10343 | Vilnius Gediminas Technical University | 45 | 2.81 |
| Analysis in Theory and Applications | journal | 19346 | Springer Netherlands | 11 | 0.00 |
| Journal of Applied Business Research | journal | 23890 | 29 | 0.28 | |
| International Journal of Applied Linguistics | journal | 7321 | Wiley-Blackwell Publishing Ltd | 51 | 2.00 |
| International Journal of Research and Method in Education | journal | 5180 | Taylor and Francis Ltd. | 34 | 2.49 |
| Syntax | journal | 3422 | Wiley-Blackwell Publishing Ltd | 29 | 0.93 |
| Transboundary and Emerging Diseases | journal | 4279 | Wiley-Blackwell Publishing Ltd | 78 | 4.95 |
| English Literary Renaissance | journal | 23442 | University of Chicago Press | 20 | 0.25 |
| Journal of Evolutionary Psychology | journal | 28897 | Akademiai Kiado | 0 | 0.00 |
| American Journal of Immunology (discontinued) | journal | 19764 | Science Publications | 12 | 1.56 |
| Year | Impact Score (IS) |
|---|---|
| 2023/2024 | Coming Soon |
| 2022 | 2.14 |
| 2021 | 1.89 |
| 2020 | 2.06 |
| 2019 | 1.99 |
| 2018 | 1.84 |
| 2017 | 1.69 |
| 2016 | 1.89 |
| 2015 | 2.22 |
| 2014 | 2.56 |
